Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signa...
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| Main Authors: | , , |
|---|---|
| Corporate Author: | |
| Format: | Electronic eBook |
| Language: | English |
| Published: |
Cham :
Springer International Publishing : Imprint: Springer,
2018.
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| Edition: | 3rd ed. 2018. |
| Series: | Springer series in advanced microelectronics ;
10. |
| Subjects: | |
| Online Access: | Full text (Wentworth users only) |